LEFM crack-tip fields

Leading Williams fields only: σij = [KⅠ fⅠij(θ) + KⅡ fⅡij(θ)]/√(2πr), with antiplane components for KⅢ. K has units MPa√m and r is in metres. These fields describe a local neighbourhood outside the material process zone; they are not a global solution or a crack-growth simulation.

Tip pixels are unresolved and colours are clipped to a stated display range. Neither changes the analytical singularity. MIT fracture mechanics notes.